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VOLUME 50 , ISSUE 1ESP ( February, 2022 ) > List of Articles

Entendiendo las Aberrometrías de Alto Orden

Ing. Steven Payan, Dr. Juan Sampaolesi

Keywords : Aberrometría de Alto Orden (AAO), Principio de Hartmann Shack, Esquiascopía Dinámica, Topografía con Disco de Plácido, Tecnología de Frente de Onda, Índice de Disfuncionalidad de la Lente (IDL) Análisis de Chang

Citation Information : Payan IS, Sampaolesi DJ. Entendiendo las Aberrometrías de Alto Orden. 2022; 50 (1ESP):4-26.

DOI: 10.5005/hos-10101-50101

Published Online: 17-02-2022

Copyright Statement:  Copyright © 2022; Jaypee Brothers Medical Publishers (P) Ltd.


Abstract

Este artículo explica las aplicaciones clínicas de las Aberraciones de Alto Orden (AAO) y la óptica detrás de las tecnologías de frente de onda disponibles para medirlas. El objetivo de la aberrometría Ray-Tracing (iTrace) se destaca al separar las aberraciones generadas por la córnea de estas generadas por el cristalino. Las aberraciones oculares totales representan la imagen en la retina y demuestran la calidad de visión general del paciente.

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